The X-ray spectrometric techniques consists nowadays an important analytical tool for the non-destructive, simultaneous and multielemental analysis of samples with interest in various disciplines, from advanced materials, biomedicine, geology, to the environmental science and archaeometrical research. For the further development of the method and the extension of its applicability to new types of materials, efforts should be focused towards:
1) to the minimization of the uncertainties of various X-ray fundamental parameters that have been tabulated in published data bases
2) to the better understanding of unusual scattering phenomena, like the resonant Raman scattering
3) to the research on the importance and contribution of various second order interactions that contribute to the
fluorescence emission from a thin layer or bulk material. The basic research in X-ray spectrometry includes all of the above fields, as well as, the study of the effect of the chemical environment in the X-ray spectra and the development of algorithms either for the study or description of X-ray fluorescence set-ups or for improving quantitative analysis.